Analysis and experimental verification of the influence of fabrication process tolerances and circuit parasitic on transient current sharing of parallel-connected SiC JFETs

Author: 
Lim J.-K., Peftitsis D., Rabkowski J., Bakowski M. and Nee H.-P.
Type of publication: 
Journal article
Year: 
2014
Published in: 
IEEE Transactions on Power Electronics, v29, n5, p2180-2191