Test Lab - Measurement and characterization

Acreo has advanced measurement and characterization capabilities and laboratories for measuring electrical, thermal, and optical component and system performances. State-of-the-art measurement equipment is available.Electrical Characterization General Capabilities

High frequency probestation	ASIC design and characterization

Electrical Measurement Capabilities

• DC-67GHz Electrical Network and Spectrum Performance
• RF and Microwave
• High frequency probe station
• Transceiver system characterization
• Mixed Signal and Digital ASIC
• Antenna Characterization Chamber
• Thermal Chamber
• Discrete and integrated component characterization

High frequency Measurement Equipment

• Logic Analyzer System Agilent 16702B
• ESG Vector Signal Generator Agilent E4438C
• PSA Spectrum Analyzer Agilent E4440
• Spectrum Analyzer Agilent E4407B
• Network Analyzer Agilent 8361C
• Noise Figure Meter Agilent N8974A
• Oscilloscope LeCroy 9362
• Power Meter Agilent E4417A
• Synth. Signal Generators Agilent 8665B (2)
• Vector Signal Analyzer Agilent 89611A
• Anechoic Antenna Chamber Orbit

Communications system performance verification